dc.contributor.advisor | Goswami, A. | en |
dc.contributor.author | Nikam, P. S. | en |
dc.date.accessioned | 2018-06-04T11:04:36Z | en |
dc.date.available | 2018-06-04T11:04:36Z | en |
dc.date.issued | 01-06-1969 | en |
dc.identifier | TH294 | en |
dc.identifier.uri | http://dspace.ncl.res.in:8080/xmlui/handle/20.500.12252/3470 | en |
dc.format.extent | 98 p. | en |
dc.publisher | CSIR-National Chemical Laboratory, Poona | en |
dc.title | Structural studies of vacuum deposited thin films by electron diffraction | en |
dc.type | Thesis(Ph.D.) | en |
local.division.division | Chemical Engineering and Process Development Division | en |
dc.description.university | University of Poona | en |